In 1977, EMI regained some of its US market share, but it peaked at just over 40%, and it was facing an uphill trek. EMI lacked the technological resources of companies such as GE, Toshiba, and Siemens. Nor had it ever truly grasped how to market its products to radiologists as well as the established players in the conventional medical imaging industry. Having Godfrey Hounsfield was a major advantage, but most of the innovation at this point had become incremental rather than revolutionary, #Sc body scannerz how to# X-ray computed tomography (also referred to as X-ray CT, CAT scan, or simply ‘CT’) is a technological advancement with expanding applications, from medical imaging and nondestructive evaluation to, more recently, dimensional metrology. The CT technique is now used to measure a specimen's geometrical dimensions (of both internal and external features). ![]() #Sc body scannerz drivers#Īs a result, CT presently contributes to dimensional inspection and geometric analysis for technology companies spanning a variety of industries such as aerospace, automotive, electronics, medical devices, plastic components, metalworking, and additive manufacturing (one of the main drivers presently pushing the use of CT for dimensional measurement). For medical diagnoses or other qualitative analyses that depend mainly on feature recognition dimensional accuracy is not necessary. In contrast, for precision engineering applications accurate dimensional measurement is the essence of X-ray CT metrology. This article describes the development of X-ray CT metrology beginning with a historical overview that spans the discovery of X-rays to the invention of CAT scan and focuses with greater detail on its expansion toward industrial dimensional measurements. Following this overview is a brief review of the current state of the art of the technology-specifically focused on issues of metrology-and of the present standardization efforts in the design of acceptance tests for evaluating the metrological performance of X-ray CT. As of writing, the CT metrology technique is still evolving with several technical issues yet to be resolved, in particular, to find better ways of expressing uncertainties associated with CT dimensional measurements.
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